Commit Graph

11 Commits

Author SHA1 Message Date
e39a655861 Add CRC32 self-test debug output 2026-06-24 22:42:46 +08:00
bbd3e3358b Fix extra brace in debug code 2026-06-24 22:38:18 +08:00
3269e83d68 Debug: check ExtRAM write-back at start/mid/end of range 2026-06-24 22:36:29 +08:00
4a67ca5c83 Add debug output for group 0 write-back and group 1 compute 2026-06-24 22:09:06 +08:00
aaefb04737 Sync asm/ (user-sample.c + Makefile) from test branch
MATMUL_GROUP_NUM defaults to 5000, overridable for fast local testing.
2026-06-24 17:01:45 +08:00
f8edd878d4 Rewrite matmul_test for CIC-IEC Stage 3 evaluation
- 5000 groups (N_GROUPS=5000), group 0 all-zero as required
- MATMUL_START before computation, MATMUL_DONE after CRC
- IEEE CRC32 over 960000-byte result region (little-endian words)
- MATMUL_CRC32=XXXXXXXX format, 8 hex digits, no 0x prefix
- Uncached ExtRAM access (0xA0000000 segment)
- Removed all debug output for minimal UART traffic
2026-06-24 16:42:08 +08:00
4a5ecc8bdc Add debug output: print A[0..3], B[0..3], C[0..5] for group 0 2026-06-24 16:35:43 +08:00
e35fa5884d Use uncached ExtRAM access (0xBC400000) to bypass CPU data cache
The open-la500 core has USE_CACHE enabled. Writes to 0x1c400000
go to the write-back data cache and never reach the SRAM model
before the testbench checks ExtRAM. Use the 0xA0000000 uncached
segment (same pattern as fft_dma/main.c).
2026-06-24 02:04:40 +08:00
b8a4fcc30b Fix matmul_base address: 0x1f500000 -> 0xbf500000
The open-la500 CPU maps 0xbfxx_xxxx to the peripheral address space
(crossbar sees 0x1fxx_xxxx). FFT uses 0xbf400000, CONFREG uses
0xbf20f100, UART uses 0xbf000000. Matmul must follow the same
convention.
2026-06-24 01:58:29 +08:00
ff6e572996 matmul_test: rewrite for ExtRAM flow, add IP error debug
- Rewrite main.c to read from ExtRAM (0x1c400000), compute
  via matmul IP, write results back. Matches testbench
  expectation of 10 groups.
- Add  in matmul_axi_slave to trace error writes
2026-06-24 01:49:02 +08:00
fbc993b846 Initial commit: Loongson FPGA SoC project for 2026 CIC-IEC 2026-06-23 01:22:45 +08:00